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1999 IEEE International Reliability Physics Symposium Proceedings by Institute of Electrical and Electronics Engineers

1999 IEEE International Reliability Physics Symposium Proceedings

Institute of Electrical and Electronics Engineers
IEEE
Sep 1999
Hardcover
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This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytical techniques and ways to build in reliability.
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Publisher IEEE
Published 1999
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