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1997 Physical and Failure Analysis of Integrated Circuits by Institute of Electrical and Electronics Engineers

1997 Physical and Failure Analysis of Integrated Circuits

Institute of Electrical and Electronics Engineers
110 pages
IEEE
Jan 1996
Paperback
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These proceedings contain all 16 of the papers presented at the 1996 IEEE Radiation Effects Data Workshop. This workshop aimed to provide a forum for radiation response data on microelectronic devices and circuits for designers of systems which must operate in radiation environments.
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About this book
Pages 110
Publisher IEEE
Published 1996
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